Research into evaluation and mitigation of external factors affecting long term reliability of airborne electronics systems is a continuing focus of several AVSI projects. Research efforts include, mitigating radiation effects on semiconductors, semiconductor wear out, challenges of using modern microprocessors and commercial-off-the-shelf (COTS) devices, and developing an integrated process for reliability prediction and a broader reliability methodology.
Avionics Systems Reliability Projects
- Semiconductor Reliability
- COTS Assurance