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Home / Projects / Other Projects / Systems Reliability / Semiconductor Reliability

Semiconductor Reliability

Developing a practicable methodology for predicting the reliability of integrated circuit semiconductors for high reliability applications based on the integration of random failure rate models and physics-of-failure (PoF) semiconductor wear out models.

Semiconductor Reliability Projects

  • Integrated Reliability Processes
  • Semiconductor Reliability
  • Methods to Account for Accelerated Semiconductor Device Wear Out
  • Reliability Prediction Software Using FARBS and MaCRO
  • Mitigating Radiation Effects on Current and Future Avionics Systems

Project Details

AFE 16, AFE 17, AFE 70, AFE 71, AFE 72, AFE 74, AFE 80, AFE 83

Current AVSI Projects

  • RF Interference with Radar Altimeters
  • Artificial Intelligence in Aerospace Systems
  • Wireless Avionics
  • New Materials for Aerospace Systems

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