This project developed a web-based software application incorporating the FARBS and MaCRO software modules for predicting electronic reliability. Program inputs will be the information nominally available to system design and reliability personnel.
The project continued research in electronics failure modeling to predict failures in the next technology node. Work was done to estimate the impact of ever decreasing feature sizes on different device families, e.g. complex CMOS logic and large CMOS memory.
Application output is a graphically displayed time dependent failure rate.
