AVSI

The Aerospace Research Cooperative

Join AVSI Member Login

  • Home
  • About
    • Research
      • Intellectual Property Rights
      • AVSI Proposal Process
    • Achievements
    • People
  • Projects
    • RF Interference with Radar Altimeters
    • SAVI
    • WAIC
    • Systems Reliability
    • Shape Memory Alloy Specifications
  • News
  • Members
    • Membership Types
    • Join AVSI
  • Contact
Home / Projects / Other Projects / Systems Reliability

Systems Reliability

Research into evaluation and mitigation of external factors affecting long term reliability of airborne electronics systems is a continuing focus of several AVSI projects. Research efforts include, mitigating radiation effects on semiconductors, semiconductor wear out, challenges of using modern microprocessors and commercial-off-the-shelf (COTS) devices, and developing an integrated process for reliability prediction and a broader reliability methodology.

Avionics Systems Reliability Projects

  • Semiconductor Reliability
    • Integrated Reliability Processes
    • Semiconductor Reliability
    • Methods to Account for Accelerated Semiconductor Device Wear Out
    • Reliability Prediction Software Using FARBS and MaCRO
    • Mitigating Radiation Effects on Current and Future Avionics Systems
  • COTS Assurance
    • COTS Assurance Methods
    • Microprocessor Evaluations
    • Thermal Management of COTS Based Avionics

Current AVSI Projects

  • RF Interference with Radar Altimeters
  • Artificial Intelligence in Aerospace Systems
  • Wireless Avionics
  • New Materials for Aerospace Systems

AVSI
753 H.R. Bright Building
3141 TAMU
710 Ross Street
College Station, TX 77843-3141
979-845-5568
Contact AVSI

The Texas A&M University System

© 2025 AVSI